X-Ray Photoemission Spectroscopy
X-ray Photoemission Spectroscopy (XPS) is a surface science technique used to investigate elemental, chemical state, and structural and electronic properties of materials. This PHI 5100 instrument is from RBD Instruments, and is housed in a Ultra High Vacuum (UHV) chamber with the base pressure of 4x10-10 Torr. It is equipped with a dual anode X-ray source (hν (Al Kα)=1486.6 eV and hν (Mg Kα)=1253.6 eV, ΔE = 0.9 eV) and a hemispherical analyzer. The system is also equipped with a Ar+ ion gun which enables depth profiling. In addition, it can be operated at room temperature as well as liquid nitrogen temperature, 80 K.